

Kewtech KT66DL Digital 12-in-1 Multifunction Tester
£1026.55 Ex VAT
£1231.86 Inc VAT
Code: KT66DL
Features & Benefits:
Product Description
Kewtech KT66DL a multifunction tester, complete with 3 & 2 wire low current loop options and EV testing facilities. For accuracy and performance like never before, engineered with a pioneering sophisticated loop testing system and a comprehensive RCD testing facility.
Features:
Two high current loop options: 25 A 0.001 Ohm resolution & 6 A 0.01 Ohm resolution
25A high current loop enables a genuine 50kA prospective short current range
Industry leading 2 & 3 wire no trip loop testing (High/Low)
55V loop test capability - suitable for 110V CTE systems
EVSE loop option
RCD: Tests Type AC, ACS, A, AS, F, B, BS & EV
EVSE 6mA DC ramp and tripping time test
UC: contact voltage test
Specifications:
Large colour dot matrix screen
Established easy to use interface with one rotary dial and four function keys
Simultaneous display of L-PE, L-N, N-PE voltage (TRMS)
Max Zs tables for current and old standards
Comprehensive RCD function including type EV & B and variable RCD test
Three modes of starting a test: single press of the test button, continuous testing and by test button in the test probe
Advanced memory - assigns DB, circuit number and type of test i.e. Zs or Ze
Features:
Two high current loop options: 25 A 0.001 Ohm resolution & 6 A 0.01 Ohm resolution
25A high current loop enables a genuine 50kA prospective short current range
Industry leading 2 & 3 wire no trip loop testing (High/Low)
55V loop test capability - suitable for 110V CTE systems
EVSE loop option
RCD: Tests Type AC, ACS, A, AS, F, B, BS & EV
EVSE 6mA DC ramp and tripping time test
UC: contact voltage test
Specifications:
Large colour dot matrix screen
Established easy to use interface with one rotary dial and four function keys
Simultaneous display of L-PE, L-N, N-PE voltage (TRMS)
Max Zs tables for current and old standards
Comprehensive RCD function including type EV & B and variable RCD test
Three modes of starting a test: single press of the test button, continuous testing and by test button in the test probe
Advanced memory - assigns DB, circuit number and type of test i.e. Zs or Ze
Brand | Kewtech |
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Download | Technical Data Sheet |
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Download | User Manual |